Solid-state image pickup device, method of manufacturing solid-state image pickup device, and electronic apparatus

ABSTRACT

There is provided a solid-state image pickup device including: a semiconductor substrate; a photodiode formed in the semiconductor substrate; a transistor having a gate electrode part or all of which is embedded in the semiconductor substrate, the transistor being configured to read a signal electric charge from the photodiode via the gate electrode; and an electric charge transfer layer provided between the gate electrode and the photodiode.

CROSS REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.15/087,733, filed Mar. 31, 2016, which is a continuation of U.S. patentapplication Ser. No. 14/889,552, filed Nov. 6, 2015, which is a nationalstage application under 35 U.S.C. 371 and claims the benefit of PCTApplication No. PCT/JP2014/002458, filed May 9, 2014, which claims thebenefit of Japanese Patent Application No. JP 2013-104000, filed May 16,2013, the entire disclosures of which are hereby incorporated herein byreference.

The present disclosure relates to solid-state image pickup devices thatinclude a photodiode, for example, in a semiconductor substrate, tomethods of manufacturing the same, and to electronic apparatusesincluding the same.

BACKGROUND ART

A solid-state image pickup device, such as a COMS (Complementary MetalOxide Semiconductor) image sensor, is manufacturable by a processsimilar to that of a CMOS integrated circuit. Such a solid-state imagepickup device includes a pixel array section in which a plurality ofpixels are arranged two-dimensionally. Also, such a solid-state imagepickup device allows, using a miniaturization technology accompanyingthe above-described process, easy formation of an active structure thathas an amplifying function for each pixel. Also, such a solid-stateimage pickup device has an advantage that a peripheral circuit sectionincluding circuits such as a drive circuit that drives the pixel arraysection, and a signal process circuit that processes an output signalfrom each pixel is integrated on the same chip (substrate) on which thepixel array section is formed. Therefore, the CMOS image sensor has beengaining increasing attention, and many studies and development on theCMOS image sensor have been made.

In recent years, for such a CMOS image sensor, there has been proposed asolid-state image pickup device in which three photodiodes that performphotoelectric conversion on light having respective wavelengths of R, G,and B are laminated in a vertical direction in one pixel (for example,PTL 1). Also, there has been proposed a structure in which twophotodiodes are laminated in one pixel (for example, PTL 2). In thesesolid-state image pickup devices, a plurality of photodiodes arelaminated in a semiconductor substrate, and therefore, for example,reading signal electric charges from part of the photodiodes isperformed with the use of a so-called vertical transistor. Further,there has been proposed a technique in which the photodiodes arelaminated next to (on side-face side of) the vertical transistor andelectric charge transfer is performed from a side face of the verticaltransistor to form a so-called over flow path at a bottom portion of thevertical transistor (for example, PTL 3).

CITATION LIST Patent Literature

[PTL 1]

JP 2009-295937A

[PTL 2]

JP 2010-114273A

[PTL 3]

JP 2012-199489A

SUMMARY Technical Problem

A vertical transistor used in a solid-state image pickup device as thosedescribed above has a gate electrode part of which may be embedded, forexample, in a semiconductor substrate. It is desirable to suppressdefect in transfer between the gate electrode of such a verticaltransistor and a photodiode, and to improve yield.

It is desirable to provide a solid-state image pickup device, a methodof manufacturing a solid-state image pickup device, and an electronicapparatus that are capable of suppressing defect in transfer in avertical transistor and of improving yield.

Solution to Problem

Solid-state image pickup devices according to illustrative embodimentsof the present disclosure include: a semiconductor substrate; aphotodiode formed in the semiconductor substrate; a transistor having agate electrode part or all of which is embedded in the semiconductorsubstrate, the transistor being configured to read a signal electriccharge from the photodiode via the gate electrode; and an electriccharge transfer layer provided between the gate electrode and thephotodiode.

Methods of manufacturing a solid-state image pickup device according toillustrative embodiments of the present disclosure include: forming atransistor having a gate electrode part or all of which is embedded in asemiconductor substrate that includes a photodiode, the transistor beingconfigured to read a signal electric charge from the photodiode via thegate electrode; and forming an electric charge transfer layer betweenthe gate electrode and the photodiode.

Electronic apparatuses according to illustrative embodiments of thepresent disclosure include a solid-state image pickup device thatincludes: a semiconductor substrate; a photodiode formed in thesemiconductor substrate; a transistor having a gate electrode part orall of which is embedded in the semiconductor substrate, the transistorbeing configured to read a signal electric charge from the photodiodevia the gate electrode; and an electric charge transfer layer providedbetween the gate electrode and the photodiode.

The solid-state image pickup devices and the electronic apparatuses ofthe above-described embodiments of the present disclosure each includethe photodiode formed in the semiconductor substrate, and the transistorconfigured to read the signal electric charge from the photodiode viathe gate electrode part or all of which is embedded in the semiconductorsubstrate. Including the electric charge transfer layer between thephotodiode and the gate electrode suppresses defect in transfer ofsignal electric charges caused by variations in positions of bottomfaces of the gate electrodes in a depth direction.

In the methods of manufacturing the solid-state image pickup device ofthe above-described embodiments of the present disclosure, thephotodiode is formed in the semiconductor substrate, and then, thetransistor is formed that is configured to read the signal electriccharge from the photodiode via the gate electrode part or all of whichis embedded in the semiconductor substrate. Forming the electric chargetransfer layer between the gate electrode and the photodiode suppressesdefect in transfer of signal electric charges caused by variations inpositions of bottom faces of the gate electrodes in a depth direction.

Advantageous Effects of Invention

According to the solid-state image pickup devices and the electronicapparatuses of the above-described embodiments of the presentdisclosure, there is included the photodiode formed in the semiconductorsubstrate, and the transistor configured to read the signal electriccharge from the photodiode via the gate electrode part or all of whichis embedded in the semiconductor substrate. By including the electriccharge transfer layer between the photodiode and the gate electrode,defect in transfer of signal electric charges caused by variations inpositions of the bottom faces of the gate electrodes in the depthdirection is suppressed. Accordingly, it is possible to suppress defectin transfer performed by the vertical transistor, and to improve yield.

According to the methods of manufacturing the solid-state image pickupdevices of the above-described embodiments of the present disclosure,the photodiode is formed in the semiconductor substrate, and then, thetransistor is formed that is configured to read the signal electriccharge from the photodiode via the gate electrode part or all of whichis embedded in the semiconductor substrate. By forming the electriccharge transfer layer between the gate electrode and the photodiode,defect in transfer of signal electric charges caused by variations inpositions of the bottom faces of the gate electrodes in the depthdirection is suppressed. Accordingly, it is possible to suppress defectin transfer performed by the vertical transistor, and to improve yield.

It is to be understood that both the foregoing general description andthe following detailed description are exemplary, and are intended toprovide further explanation of the technology as claimed.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a cross-sectional schematic diagram showing an outlineconfiguration of a solid-state image pickup device according to anillustrative first embodiment of the present disclosure.

FIG. 2A is a cross-sectional schematic diagram for explaining anillustrative method of manufacturing the solid-state image pickup deviceshown in FIG. 1.

FIG. 2B is a cross-sectional schematic diagram showing a processfollowing an illustrative process shown in FIG. 2A.

FIG. 2C is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 2B.

FIG. 2D is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 2C.

FIG. 2E is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 2D.

FIG. 3A is a cross-sectional schematic diagram showing an illustrativeconnection configuration of a gate electrode and a photodiode in a casewhere an electric charge transfer layer is not formed.

FIG. 3B is a cross-sectional schematic diagram for explaining anillustrative defect in connection caused by variations in positions ofbottom faces of the gate electrodes in a depth direction (in a casewhere the position of the gate electrode is shallow).

FIG. 3C is a cross-sectional schematic diagram for explaining anillustrative defect in connection caused by variations in positions ofthe bottom faces of the gate electrodes in the depth direction (in acase where the position of the gate electrode is deep).

FIG. 4A is a cross-sectional schematic diagram showing an illustrativeconnection configuration of a gate electrode in the solid-state imagepickup device shown in FIG. 1 (in a case where the position of the gateelectrode is shallow).

FIG. 4B is a cross-sectional schematic diagram showing an illustrativeconnection configuration of the gate electrode in the solid-state imagepickup device shown in FIG. 1 (in a case where the position of the gateelectrode is deep).

FIG. 5 is a cross-sectional schematic diagram showing an illustrativeexample of a vertical transistor.

FIG. 6 is a cross-sectional schematic diagram showing an illustrativeexample of the vertical transistor.

FIG. 7 is a cross-sectional schematic diagram showing an outlineconfiguration of a solid-state image pickup device according to anillustrative second embodiment of the present disclosure.

FIG. 8A is a cross-sectional schematic diagram for explaining anillustrative method of manufacturing the solid-state image pickup deviceshown in FIG. 7.

FIG. 8B is a cross-sectional schematic diagram showing an illustrativeprocess following a process shown in FIG. 8A.

FIG. 8C is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 8B.

FIG. 9A is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 8C.

FIG. 9B is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 9A.

FIG. 10A is a cross-sectional schematic diagram showing an illustrativeconnection configuration of a gate electrode in the solid-state imagepickup device shown in FIG. 7 (in a case where the position of the gateelectrode is shallow).

FIG. 10B is a cross-sectional schematic diagram showing an illustrativeconnection configuration of the gate electrode in the solid-state imagepickup device shown in FIG. 7 (in a case where the position of the gateelectrode is deep).

FIG. 11 is a cross-sectional schematic diagram showing an outlineconfiguration of a solid-state image pickup device according to anillustrative third embodiment of the present disclosure.

FIG. 12A is a cross-sectional schematic diagram for explaining anillustrative method of manufacturing the solid-state image pickup deviceshown in FIG. 11.

FIG. 12B is a cross-sectional schematic diagram showing an illustrativeprocess following a process shown in FIG. 12A.

FIG. 12C is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 12B.

FIG. 12D is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 12C.

FIG. 12E is a cross-sectional schematic diagram showing an illustrativeprocess following the process shown in FIG. 12D.

FIG. 13 is a cross-sectional schematic diagram showing an illustrativeconnection configuration of a gate electrode in the solid-state imagepickup device shown in FIG. 11 (in a case where the position of the gateelectrode is shallow).

FIG. 14 is a functional block diagram showing an illustrative generalconfiguration of the solid-state image pickup device shown in FIG. 1.

FIG. 15 is a functional block diagram showing an illustrativeconfiguration of an image pickup apparatus according to Applicationexample 1.

FIG. 16 is a functional block diagram showing an illustrativeconfiguration of a capsule-type endoscopic camera according toApplication example 2-1.

FIG. 17 is a functional block diagram showing an illustrativeconfiguration of an insertion-type endoscopic camera according toApplication example 2-2.

FIG. 18 is a functional block diagram showing an illustrativeconfiguration of a vision chip according to Application example 3.

FIG. 19 is a functional block diagram showing an illustrativeconfiguration of a biosensor according to Application example 4.

DESCRIPTION OF EMBODIMENTS

Some illustrative embodiments of the present disclosure will bedescribed below in detail with reference to the drawings. It is to benoted that the description will be provided in the following order.

-   1. First Embodiment (an example of a solid-state image pickup device    that includes an electric charge transfer layer adjacent to a bottom    face of a concave section in a semiconductor substrate)-   2. Second Embodiment (an example of a solid-state image pickup    device that includes a dark current suppression layer between the    bottom face of the concave section in the semiconductor substrate    and an electric charge transfer layer)-   3. Third Embodiment (an example of a solid-state image pickup device    in which the electric transfer layer is formed before formation of    the concave section in the semiconductor substrate)-   4. General Configuration Example of Solid-state Image Pickup Device-   5. Application Examples 1 to 4 (examples of electronic apparatuses)

First Embodiment

Configuration

FIG. 1 schematically illustrates a cross-sectional configuration of asolid-state image pickup device of a first embodiment of the presentdisclosure. FIG. 1 shows a region corresponding to one pixel in a pixelsection (a pixel section 1 a shown in FIG. 14) which will be describedlater. In this solid-state image pickup device, one or a plurality ofphotodiodes (two photodiodes 11A (PD1) and 11B (PD2), in this example)are laminated in a semiconductor substrate 21 that may be made of amaterial such as n-type silicon (Si). One face of the semiconductorsubstrate 21 serves as a circuit formation face S1. A multi-layeredwiring layer that is not illustrated is formed on the circuit formationface S1. In the present embodiment, a face of the semiconductorsubstrate 21 that is opposite from the circuit formation face S1 servesas a light receiving face S2, and the present embodiment has a devicestructure of a so-called back illumination type. Components such as anon-chip lens that are not illustrated are provided on the lightreceiving face S2.

The photodiodes 11A and 11B may be formed, for example, in a p-typesemiconductor region formed in the n-type semiconductor substrate 21.The photodiodes 11A and 11B may include, for example, photoelectricconversion layers that perform photoelectric conversion on light havingwavelengths different from each other. For example, the photodiode 11Amay include a photoelectric conversion layer that selectively absorbslight of red (R), and the photodiode 11B may include a photoelectricconversion layer that selectively absorbs light of blue (B). Thesephotodiodes 11A and 11B each may include, for example, an n-type orp-type semiconductor layer as the photoelectric conversion layer thataccumulates signal electric charges. In this example, the photodiodes11A and 11B each include an n-type semiconductor layer that accumulateselectrons as the signal electric charge, as an example case. However,the photodiodes 11A and 11B each may include a p-type semiconductorlayer, and for example, may have a structure in which the p-type andn-type semiconductor layers are laminated to form a p-n junction, ap-n-p junction, etc. “First conductivity type” and “second conductivitytype” in the present disclosure may indicate, for example, a combinationof p-type and n-type, or a combination of n-type and p-type. However, inthe present embodiment, description will be given referring to anexample case in which “first conductivity type” is “n-type” and “secondconductivity type” is “p-type”.

These photodiodes 11A and 11B are each connected to a transistor fortransferring signal electric charges. Out of the photodiodes 11A and11B, for example, the photodiode (the photodiode 11B, in this example)that is formed in a deep position in the semiconductor substrate 21 (ina position away from the circuit formation face S1 of the semiconductorsubstrate 21) is connected to a vertical transistor 10.

The vertical transistor 10 is an electric charge transfer transistor,and includes a gate electrode 14, where at least a portion or all of thegate electrode 14 is embedded in the semiconductor substrate 21.Specifically, the semiconductor substrate 21 includes a concave sectionH, and the gate electrode 14 is formed in an embedded manner in thisconcave section H with a gate insulating film 34 in between. Other pixeltransistors (such as an amplifier transistor, a reset transistor, and aselection transistor) that are not illustrated are formed on the circuitformation face S1. In the vertical transistor 10, for example, thephotodiode 11B may serve as a source, for example, an FD 12 may serve asa drain, and a channel (an active layer) that is not illustrated may beformed in a region below the gate insulating film 34.

The gate electrode 14 may be configured, for example, of anelectrically-conductive material such as polysilicon doped with n-typeor p-type impurity at high concentration. The gate electrode 14 isconnected to the wiring layer (not illustrated) formed on the circuitformation face S1. The gate insulating film 34 may be configured, forexample, of an insulating film material such as a silicon oxide film.

The concave section H is formed by digging in a depth direction of thesemiconductor substrate 21 (the vertical direction, a thicknessdirection) in part of the semiconductor substrate 21. The concavesection H configures a groove having a shape such as a prismatic shapeor a cylindrical shape. The concave section H is provided to allow abottom face Sb thereof, for example, to face part of the photodiode 11B.The bottom face Sb of the concave section H may be in contact with thephotodiode 11B, or may be located in the photodiode 11B. Alternatively,the bottom face Sb of the concave section H may be away from thephotodiode 11B. In this example, there is illustrated a case, as anexample, in which the bottom face Sb of the concave section H is awayfrom the photodiode 11B with a predetermined distance. At the bottomface Sb of the concave section H, the gate electrode 14 is connected tothe photodiode 11B via an electric charge transfer layer 13.

The electric charge transfer layer 13 is formed between the gateelectrode 14 and the photodiode 11B, and configures part of a transferpath of signal electric charges from the photodiode 11B to the gateelectrode 14 and the FD 12. The electric charge transfer layer 13 may bean impurity diffusion layer that may have, for example, conductivitythat is the same as that of the photoelectric conversion layer in thephotodiode 11B, for example, in the semiconductor substrate 21. In otherwords, the electric charge transfer layer 13 may be an n-type impuritydiffusion layer. Therefore, the electric charge transfer layer 13 servesas the transfer path of the signal electric charges, and serves also asa photoelectric conversion layer. The electric charge transfer layer 13has a thickness t that may be, for example, about from 50 nm to 2000 nm.Part or all of the electric charge transfer layer 13 is connected to thephotoelectric conversion layer (the n-type semiconductor layer) in thephotodiode 11B.

In the present illustrative embodiment, the electric charge transferlayer 13 is adjacent to the bottom face Sb of the concave section H.Although the details will be described later, the electric chargetransfer layer 13 is formed by performing ion implantation with respectto the bottom face Sb using self-alignment, after forming the concavesection H.

Manufacturing Method

The device structure of the solid-state image pickup device shown inFIG. 1 may be manufactured, for example, as follows. Specifically, asshown in FIG. 2A, for example, a mask 120 made of a material such assilicon nitride (SiN) may be formed, by a method such as a CVD method,on the semiconductor substrate 21 on which the photodiodes 11A and 11B,etc. are formed. By dry etching or wet etching with the use of the mask120, the concave section H is formed in the semiconductor substrate 21.At this time, a position d0 (a reference position, a position to be thecenter of design) of the bottom face Sb of the concave section H is notparticularly limited. The position d0 may be set to be matched with aposition of a surface of the photodiode 11B or to be shifted from theposition of the surface of the photodiode 11B. One reason for this maybe that the electric charge transfer layer 13 improves freedom in theposition, in the depth direction, of the bottom face Sb of the concavesection H, as will be described later. For example, considering a casewhere the concave section H is formed deeply (which will be describedlater), the position d0 may be set in a shallower region (in a regioncloser to the circuit formation face S1) compared to a surface F1 of thephotodiode 11B, as in the present illustrative embodiment. Beforeforming the concave section H, a concave-section formation region in thesemiconductor substrate 21 may be doped with, for example, a p-typeimpurity with the use of a resist mask, and thereby a p-type region(which is not illustrated) is formed in advance. Therefore, the verticaltransistor 10 has a configuration in which side faces of the concavesection H (side faces of the gate electrode 14) are covered with thep-type region.

Subsequently, as shown in FIG. 2B, for example, an impurity D that hasconductivity (of an n-type, in this example) same as that of thephotodiode 11B may be injected, for example, by ion implantation withrespect to the bottom face Sb of the concave section H. Thereafter, asshown in FIG. 2C, the mask 120 is removed from the semiconductorsubstrate 21. Thus, the electric charge transfer layer 13, for example,an n-type semiconductor region is formed, using self-alignment, to beadjacent to the bottom face Sb of the concave section H in thesemiconductor substrate 21. The thickness t of the electric chargetransfer layer 13 is adjustable by appropriately setting variousconditions such as a dose amount in ion implantation and injectionenergy.

Subsequently, as shown in FIG. 2D, the gate insulating film 34 made ofthe above-described material may be formed to cover the bottom face Sband the side faces of the concave section H, for example, by thermallyoxidizing a silicon oxide film. However, this is not limitative, andother methods such as a CVD method and a sputtering method may be used.

Subsequently, as shown in FIG. 2E, the gate electrode 14 made of theabove-described material or the like is formed. Specifically, apolysilicon film may be formed, by a method such as an LP-CVD (LowPressure-Chemical Vapor Deposition) method, on the semiconductorsubstrate 21 to fill the concave section H with the polysilicon film.During the formation of the polysilicon film, the polysilicon film maybe doped, for example, with a p-type or n-type impurity at highconcentration. Thereafter, the polysilicon film doped with the impuritymay be patterned in a predetermined shape, for example, by etching usinga photolithography method, and thereby, the gate electrode 14 is formed.In such a manner, the vertical transistor 10 is formed.

After the wiring layer is formed on the circuit formation face S1 of thesemiconductor substrate 21, the semiconductor substrate 21 is ground tohave a favorable and/or improved thickness, and thereby, the lightreceiving face S2 is formed. Components such as an on-chip lens may beformed on the light receiving face S2 as necessary. Thus, thesolid-state image pickup device shown in FIG. 1 is completed.

Functions and Effects

In the solid-state image pickup device of the present embodiment, whenlight L enters the light receiving face S2, light that has a selectivewavelength (for example, blue light) out of the light L is absorbed bythe photodiode 11B, and is subjected to photoelectric conversion. Lightthat has a selective wavelength (for example, red light) out of thelight passed through the photodiode 11B is absorbed by the photodiode11A, and is subjected to photoelectric conversion. Signal electriccharges (for example, electrons) generated by the photoelectricconversion are transferred, at predetermined timings, for example, tothe FDs (floating diffusions) for each of the photodiode 11A and 11B.The transferred signal electric charges are read out to signal lines(vertical signal lines Lsig) which will be described later. Out of thesesignal electric charges, the signal electric charges generated in thephotodiode 11B are transferred to the FD 12 via the gate electrode 14 ofthe vertical transistor 10.

In such an illustrative manner, in the device structure in which theplurality of photodiodes 11A and 11B are laminated in the semiconductorsubstrate 21, reading of the signal electric charges from the photodiode11B that is arranged in a deeper position (in a position farther fromthe circuit formation face S2) is performed with the use of the verticaltransistor 10. For example, as shown in FIG. 3A, the signal electriccharges are transferred from the photodiode 11B to the FD 12 via thegate electrode 14 by connecting the gate electrode 14 to the photodiode11B at the bottom portion (the bottom face Sb of the concave section H)of the vertical transistor 10.

However, in such a vertical transistor 10, variations in positions ofthe bottom face of the gate electrode 14 in the depth direction(variations in positions of the bottom face of the concave section H)occur, and these variations easily result in defects in transfer.Specifically, as shown in FIG. 3A, in the manufacturing process, evenwhen a position d₁₀₀ (a reference position, a position of the center ofdesign) of the bottom face Sb of the concave section H is set to be justin contact with the photodiode 11B, the concave section H may be formed,in some cases, in a shallower position (FIG. 3B) or in a deeper position(FIG. 3C). As shown in FIG. 3B, when the concave section H is formed ina position shallower than the position d₁₀₀ (when the bottom face Sb isin a position diol), the photodiode 11B is further from the verticaltransistor 10. Accordingly, a so-called potential barrier is caused inthe transfer path, and a defect is caused in transferring the electriccharges. On the other hand, as shown in FIG. 3C, when the concavesection H is formed at a position deeper than the position d₁₀₀ (whenthe bottom face Sb is in a position d₁₀₂), a contact portion of thephotodiode 11B and the vertical transistor 10 is excessively large.Accordingly, a so-called potential dip is caused, and a defect intransfer is caused.

In the present illustrative embodiment, the electric charge transferlayer 13 is provided between such a vertical transistor 10 (the gateelectrode 14) and the photodiode 11B. And in various embodiments, theelectric charge transfer layer 13 may be provided in contact with such avertical transistor 10 (the gate electrode 14) and the photodiode 11B.Therefore, it is possible to suppress defects in transfer that arecaused by variations in positions of the bottom face of the gateelectrode 14 in the depth direction, as described herein. Specifically,as shown in FIG. 4A, even when the concave section H is formed in aposition shallower than the position d0 (when the bottom face Sb is in aposition d1), the photodiode 11B is connected to the vertical transistor10 via the electric charge transfer layer 13. Therefore, a defect intransferring the signal electric charges is suppressed. On the otherhand, as shown in FIG. 4B, even when the concave section H is formed ina position deeper than the position d0 (when the bottom face Sb is in aposition d2), a defect in transferring the signal electric chargescaused by potential dip as described above is suppressed. For example,it is possible to suppress defects in transfer when the concave sectionH is formed in a deeper position, for example, by setting the positiond0 that is to be a reference for the bottom face Sb of the concavesection H in a shallower position in advance.

As described above, the present illustrative embodiment includes thephotodiodes 11A and 11B that are formed in the semiconductor substrate21, and the vertical transistor 10 that has the gate electrode 14, partor all of which is embedded in the semiconductor substrate 21. Byincluding the electric charge transfer layer 13 between the photodiode11B and the gate electrode 14, it is possible to suppress defects intransferring the signal electric charges caused by variations inpositions of the bottom face of the gate electrode 14 in the depthdirection. Therefore, it is possible to suppress defect in transferperformed by the vertical transistor, and to improve yield.

Moreover, in the present illustrative embodiment, the electric chargetransfer layer 13 is formed only at the bottom portion of the verticaltransistor 10. Therefore, the present illustrative embodiment also hasan effect, for example, that spectroscopic characteristics of thelaminated photodiodes 11A and 11B are improved. One reason for this maybe that it is easier to secure a larger formation region of thephotodiode 11A that performs photoelectric conversion on red light.

The above-described electric charge transfer layer 13 is applicable tovarious types of device structures that use a vertical transistor inorder to read signal electric charges from a photodiode in asemiconductor substrate. For example, as shown in FIG. 5, theabove-described electric charge transfer layer 13 may be applicable alsoto a structure in which three photodiodes (PD3, PD4, and PD5) that arecapable of performing photoelectric conversion on red light (Lr), greenlight (Lg), and blue light (Lb), respectively, are laminated in thesemiconductor substrate 21, and vertical transistors (Tr1, Tr2, and Tr3)are connected to the respective photodiodes. Alternatively, as shown inFIG. 6, the above-described electric charge transfer layer 13 may beapplicable to a structure in which one (common) vertical transistor(Tr4) is provided for two laminated photodiodes (PD6 and PD7). Asdescribed above, the above-described electric charge transfer layer 13is applicable to various types of device structures that use verticaltransistors.

The following description will be given regarding other illustrativeembodiments and modifications of the solid-state image pickup deviceaccording to the above-described first embodiment. Hereinafter,components similar to those in the above-described first embodiment willbe designated with the same numerals and description thereof will beomitted as appropriate.

Second Embodiment

Configuration

FIG. 7 schematically illustrates a cross-sectional configuration of asolid-state image pickup device of a second embodiment of the presentdisclosure. FIG. 7 shows a region corresponding to one pixel in thepixel section (the pixel section 1 a shown in FIG. 14) which will bedescribed later. This solid-state image pickup device includes one or aplurality of photodiodes (two photodiodes 11A and 11B, in this example)in the semiconductor substrate 21, as in the above-described firstembodiment. Also, a multi-layered wiring layer that is not illustratedis formed on the circuit formation face S1 of the semiconductorsubstrate 21. The present embodiment has a device structure of aso-called back illumination type in which a face, of the semiconductorsubstrate 21, opposite from the circuit formation face S1 serves as thelight receiving face S2. Components such as an on-chip lens that are notillustrated are provided on the light receiving face S2.

Also in the present embodiment, as in the above-described firstembodiment, the photodiodes 11A and 11B are each connected to atransistor for transferring signal electric charges. Out of thephotodiodes 11A and 11B, the photodiode 11B is connected to the verticaltransistor 10. The vertical transistor 10 includes the gate electrode14. The gate electrode 14 is provided to allow the concave section H inthe semiconductor substrate 21 to be filled with part or all of the gateelectrode 14 with the gate insulating film 34 in between. The concavesection H may be provided to allow the bottom face Sb thereof, forexample, to face part of the photodiode 11B. The gate electrode 14 isconnected to the photodiode 11B via the electric charge transfer layer13 at the bottom face Sb.

However, in the present embodiment, a dark current suppression layer 13a is further formed between the bottom face Sb of the concave section Hand the electric charge transfer layer 13. The dark current suppressionlayer 13 a is an impurity diffusion layer that exhibits conductivity(for example, of a p-type) different from that of the electric chargetransfer layer 13. The dark current suppression layer 13 a may have athickness, for example, about from 5 nm to 100 nm, that is sufficientlysmaller than the thickness t of the electric charge transfer layer 13.In such a manner, the dark current suppression layer 13 a and theelectric charge transfer layer 13 are laminated in order from the bottomface Sb of the concave section H in the present embodiment. Suchelectric charge transfer layer 13 and dark current suppression layer 13a are formed by performing ion implantation in a multiple-step mannerwith respect to the bottom face Sb using so-called self-alignment, afterforming the concave section H.

Manufacturing Method

The device structure of the solid-state image pickup device shown inFIG. 7 may be manufactured, for example, as follows. Specifically, asshown in FIG. 8A, for example, the concave section H may be formed inthe semiconductor substrate 21, for example, with the use of the mask120 of silicon nitride that may be formed by the CVD method in a mannersimilar to that in the above-described first embodiment. On thesemiconductor substrate 21, the photodiodes 11A and 11B have beenformed. At this time, the position d0 of the bottom face Sb of theconcave section H is not particularly limited as described above. Forexample, taking into consideration of a case where the concave section His formed deeply (which will be described later), the position d0 may beset in a shallower region (in a region closer to the circuit formationface S1) compared to the surface F1 of the photodiode 11B.

Subsequently, the electric charge transfer layer 13 and the dark currentsuppression layer 13 a are formed, for example, by ion implantation in amultiple-step manner with respect to the bottom face Sb of the concavesection H. Specifically, as shown in FIG. 8B, for example, an impurityD1 that exhibits conductivity (for example, of an n-type) the same asthat of the photodiode 11B may be injected. Thereafter, an impurity D2that exhibits conductivity (for example, of a p-type) opposite therefromis injected. Thereafter, as shown in FIG. 8C, the mask 120 is removedfrom the semiconductor substrate 21. Thus, the electric charge transferlayer 13 and the dark current suppression layer 13 a are formed usingself-alignment. Also in the present illustrative embodiment, thethicknesses of the electric charge transfer layer 13 and the darkcurrent suppression layer 13 a are adjustable by appropriately settingvarious conditions such as a dose amount and injection energy.

Subsequently, as shown in FIG. 9A, the gate insulating film 34 made ofthe above-described material may be formed in a manner similar to thatin the above-described first embodiment. Subsequently, as shown in FIG.9B, the gate electrode 14 made of the above-described material is formedin a manner similar to that in the above-described first embodiment.Thus, the vertical transistor 10 is formed. At last, after the wiringlayer is formed on the circuit formation face S1 of the semiconductorsubstrate 21, the semiconductor substrate 21 is ground, and componentssuch as on-chip lens may be formed on the light receiving face S2 asnecessary. Thus, the solid-state image pickup device shown in FIG. 7 iscompleted.

Functions and Effects

In the solid-state image pickup device of the present illustrativeembodiment, as in the above-described first embodiment, when the light Lenters the light receiving face S2, light with predetermined wavelengthsis subjected to photoelectric conversion by the respective photodiodes11A and 11B. Signal electric charges (for example, electrons) generatedby the photoelectric conversion are transferred, at predeterminedtimings, to the FDs. Thereafter, the transferred signal electric chargesare read out to the signal lines (the vertical signal lines Lsig) whichwill be described later. Out of these signal electric charges, thesignal electric charges generated in the photodiode 11B are transferredto the FD 12 via the gate electrode 14 of the vertical transistor 10.

Also in the present illustrative embodiment, the electric chargetransfer layer 13 is provided between the vertical transistor 10 (thegate electrode 14) and the photodiode 11B. Therefore, it is possible tosuppress defect in transfer that is caused by variations in positions ofthe bottom face of the gate electrode 14 in the depth direction, as inthe above-described first embodiment. Specifically, as shown in FIG.10A, even when the concave section H is formed in a position shallowerthan the position d0 (when the bottom face Sb is in a position d1), thephotodiode 11B is connected to the vertical transistor 10 via theelectric charge transfer layer 13. Therefore, defect in transferring thesignal electric charges is suppressed. On the other hand, as shown inFIG. 10B, even when the concave section H is formed in a position deeperthan the position d0 (when the bottom face Sb is in a position d2),defect in transferring the signal electric charges caused by potentialdip as described above is suppressed. For example, it is possible tosuppress defect in transfer when the concave section H is formed in adeeper position, for example, by setting the position d0 that is to be areference for the bottom face Sb of the concave section H in a shallowerposition in advance.

Moreover, in the present illustrative embodiment, the dark currentsuppression layer 13 a is formed between the bottom face Sb of theconcave section H and the electric charge transfer layer 13. Therefore,even in a case, for example, where digging damage of the concave sectionH is caused (a damage is caused, for example, in the bottom face Sbduring etching), it is possible to suppress occurrence of dark currentcaused by the digging damage.

As described above, the present illustrative embodiment includes thephotodiodes 11A and 11B that are formed in the semiconductor substrate21, and the vertical transistor 10 that has the gate electrode 14 partor all of which is embedded in the semiconductor substrate 21. Byincluding the electric charge transfer layer 13 between the photodiode11B and the gate electrode 14, it is possible to suppress defect intransferring the signal electric charges caused by variations inpositions of the bottom face of the gate electrode 14 in the depthdirection. Therefore, it is possible to obtain an effect equivalent tothat in the above-described first embodiment. Moreover, it is possibleto suppress, by the dark current suppression layer 13 a, occurrence ofdark current caused by the digging damage of the concave section H.

Third Embodiment

Configuration

FIG. 11 schematically illustrates a cross-sectional configuration of asolid-state image pickup device of a third embodiment of the presentdisclosure. FIG. 11 shows a region corresponding to one pixel in thepixel section (the pixel section 1 a shown in FIG. 14) which will bedescribed later. This solid-state image pickup device includes one or aplurality of photodiodes (two photodiodes 11A and 11B, in this example)in the semiconductor substrate 21, as in the above-described firstembodiment. Also, a multi-layered wiring layer that is not illustratedis formed on the circuit formation face S1 of the semiconductorsubstrate 21. The present illustrative embodiment has a device structureof a so-called back illumination type in which a face, of thesemiconductor substrate 21, opposite from the circuit formation face S1serves as the light receiving face S2. Components such as an on-chiplens that are not illustrated are provided on the light receiving faceS2.

Also in the present illustrative embodiment, the photodiodes 11A and 11Bare each connected to a transistor for transferring signal electriccharges, as in the above-described first embodiment. Out of thephotodiodes 11A and 11B, the photodiode 11B is connected to the verticaltransistor 10. The vertical transistor 10 includes the gate electrode14. The gate electrode 14 is provided to allow the concave section H inthe semiconductor substrate 21 to be filled with part or all of the gateelectrode 14 with the gate insulating film 34 in between. The concavesection H may be provided to allow the bottom face Sb thereof, forexample, to face part of the photodiode 11B. The gate electrode 14 isconnected to the photodiode 11B via the electric charge transfer layer13 at the bottom face Sb.

However, in the present illustrative embodiment, a timing for formingthe concave section H and a timing for forming the electric chargetransfer layer 13 are different from those in the above-described firstembodiment. Specifically, in the present embodiment, the concave sectionH is formed after forming the electric charge transfer layer 13.Therefore, in terms of device structure, the electric charge transferlayer 13 covers not only the bottom face Sb of the concave section H butalso part of the side faces of the concave section H. However, theelectric charge transfer layer 13 does not necessarily cover part of theside faces of the concave section H. In other words, the electric chargetransfer layer 13 may be in contact only with the bottom face Sb. Inthis case, the device structure in the present embodiment is almost thesame as the device structure in the above-described first embodiment(FIG. 1).

Manufacturing Method

The device structure of the solid-state image pickup device shown inFIG. 11 may be manufactured, for example, as follows. Specifically, asshown in FIG. 12A, for example, a photoresist 121 may be formed on thesemiconductor substrate 21 on which the photodiodes 11A and 11B, etc.are formed, and the formed photoresist 121 is patterned. Subsequently,as shown in FIG. 12B, the electric charge transfer layer 13 is formed inthe semiconductor substrate 21 with the use of the photoresist 121 as amask. Specifically, the impurity D is injected in a predetermined depthposition of the semiconductor substrate 21 (in a position determined inconsideration of variations in positions of the bottom face of theconcave section H in the depth direction) by performing ionimplantation. Thereafter, the photoresist 121 is peeled off from thesemiconductor substrate 21. Subsequently, as shown in FIG. 12C, theconcave section H is formed in the semiconductor substrate 21 in amanner similar to that in the above-described first embodiment. At thistime, the position d0 of the bottom face Sb of the concave section H isnot particularly limited as described above. However, in the presentillustrative embodiment, the position d0 may be set in a regionshallower than the surface F1 of the photodiode 11B (in a region closerto the circuit formation face S1).

Subsequently, as shown in FIG. 12D, the gate insulating film 34 made ofthe above-described material may be formed in a manner similar to thatin the above-described first embodiment. Subsequently, as shown in FIG.12E, the gate electrode 14 made of the above-described material isformed in a manner similar to that in the above-described firstembodiment. Thus, the vertical transistor 10 is formed. At last, afterthe wiring layer is formed on the circuit formation face S1 of thesemiconductor substrate 21, the semiconductor substrate 21 is ground,and components such as on-chip lens may be formed on the light receivingface S2 as necessary. Thus, the solid-state image pickup device shown inFIG. 11 is completed.

In such a manner, the electric charge transfer layer 13 may be formed inadvance, by ion implantation, in a region in which variations in depthof the concave section H is assumed to be caused.

Functions and Effects

In the solid-state image pickup device of the present illustrativeembodiment, as in the above-described first embodiment, when the light Lenters the light receiving face S2, light with predetermined wavelengthsis subjected to photoelectric conversion by the respective photodiodes11A and 11B. Signal electric charges (for example, electrons) generatedby the photoelectric conversion are transferred, at predeterminedtimings, to the FDs. Thereafter, the transferred signal electric chargesare read out to the signal lines (the vertical signal lines Lsig) whichwill be described later. Out of these signal electric charges, thesignal electric charges generated in the photodiode 11B are transferredto the FD 12 via the gate electrode 14 of the vertical transistor 10.

Also in the present embodiment, the electric charge transfer layer 13 isprovided between the vertical transistor 10 (the gate electrode 14) andthe photodiode 11B. Therefore, it is possible to suppress defect intransfer that is caused by variations in positions of the bottom face ofthe gate electrode 14 in the depth direction. Specifically, as shown inFIG. 13, even when the concave section H is formed in a positionshallower than the position d0 (when the bottom face Sb is in a positiond1), the photodiode 11B is connected to the vertical transistor 10 viathe electric charge transfer layer 13. Therefore, defect in transferringthe signal electric charges is suppressed. On the other hand, when theconcave section H is formed in a position deeper than the position d0(when the bottom face Sb is in a position d2), influence of potentialdip is reduced by adjusting, for example, impurity concentration (doseamount) in the electric charge transfer layer 13.

As described above, the present illustrative embodiment includes thephotodiodes 11A and 11B that are formed in the semiconductor substrate21, and the vertical transistor 10 that has the gate electrode 14 partor all of which is embedded in the semiconductor substrate 21. Byincluding the electric charge transfer layer 13 between the photodiode11B and the gate electrode 14, it is possible to suppress defect intransferring the signal electric charges caused by variations inpositions of the bottom face of the gate electrode 14 in the depthdirection. Therefore, it is possible to obtain an effect equivalent tothat in the above-described first embodiment.

Device Configuration

FIG. 14 illustrates a general configuration of any of the solid-stateimage pickup devices described above in the respective embodiments(hereinafter, referred to as “solid-state image pickup device 1”). Thesolid-state image pickup device 1 includes the pixel section 1 a as animage pickup area. Also, the solid-state image pickup device 1 includesa peripheral circuit section 130 that may include, for example, a rowscanning section 131, a horizontal selection section 133, a horizontalselection section 134, and a system control section 132.

The pixel section 1 a may include a plurality of unit pixels (pixels P)that are arranged two-dimensionally in a matrix. With respect to thepixels P, for example, pixel drive lines Lread (specifically, rowselection lines and reset control lines) may be wired for respectivepixel rows, and vertical signal lines Lsig may be wired for respectivepixel columns. The pixel drive line Lread transmits a drive signal forreading a signal from the pixel. One end of the pixel drive line Lreadis connected to an output end corresponding to each row of the rowscanning section 131.

The row scanning section 131 is configured of components such as a shiftregister and an address decoder. The row scanning section 131 is a pixeldrive section that may drive the respective pixels P in the pixelsection 1 a, for example, on pixel row basis. A signal outputted fromeach pixel P in the pixel row selectively scanned by the row scanningsection 131 is supplied to the horizontal selection section 133 via eachof the vertical signal lines Lsig. The horizontal selection section 133is configured of components such as an amplifier and a horizontalselection switch that are provided for each vertical signal line Lsig.

The horizontal selection section 134 is configured of components such asa shift register and an address decoder. The horizontal selectionsection 134 sequentially drives the respective horizontal selectionswitches in the horizontal selection section 133 while scanning therespective horizontal selection switches. By the selective scanningperformed by the horizontal selection section 134, the signals from therespective pixels transmitted through the respective vertical signallines Lsig are sequentially outputted to the horizontal signal lines135. The signals outputted to the horizontal signal lines 135 aretransmitted to the outside of a substrate 11 via the horizontal signallines 135.

The circuit part including the row scanning section 131, the horizontalselection section 133, the horizontal selection section 134, and thehorizontal signal lines 135 may be formed directly on the substrate 11,or may be provided on an external control IC. Alternatively, the circuitpart may be formed on another substrate that is connected to thesubstrate 11 with the use of a cable, etc.

The system control section 132 receives a clock supplied from theoutside, data that instructs an operation mode, etc. Also, the systemcontrol section 132 outputs data such as internal information of thesolid-state image pickup device 1. The system control section 132further includes a timing generator that generates various timingsignals. The system control section 132 controls drive of the peripheralcircuits such as the row scanning section 131, the horizontal selectionsection 133, and the horizontal selection section 134, based on thevarious timing signals generated by the timing generator.

Application Example 1

The above-described solid-state image pickup device 1 is applicable tovarious types of electronic apparatuses that have an image pickupfunction. Examples of such electronic apparatuses may include camerasystems such as digital still cameras and video camcorders, and mobilephones that have an image pickup function. FIG. 15 is a functional blockdiagram illustrating a general configuration of an image pickupapparatus (image pickup apparatus 2) according to Application example 1.The image pickup apparatus 2 may be, for example, a digital still cameraor a digital video camcorder. The image pickup apparatus 2 may includean optical system 221, a shutter device 222, the solid-state imagepickup device 1 (the pixel section 1 a), a drive circuit 224, a signalprocess circuit 223, and a control section 225.

The optical system 221 leads image light (incident light) from a subjectto the pixel section 1 a in the solid-state image pickup device 1. Theshutter device 222 controls a period of light illumination on thesolid-state image pickup device 1 (exposure period) and a period oflight shielding for the solid-state image pickup device 1. The drivecircuit 224 performs open-close drive of the shutter device 222, anddrives exposure operation and signal reading operation in thesolid-state image pickup device 1 (the pixel section 1 a). The signalprocess circuit 223 performs predetermined processes on output signalsfrom the solid-state image pickup device 1. Examples of thepredetermined processes may include various correction processes such asa demosaic process and a white balance adjustment process. The controlsection 225 may be configured, for example, of a microcomputer. Thecontrol section 225 controls shutter drive operation and image sensordrive operation of the drive circuit 224, and controls the signalprocess operation of the signal process circuit 223.

In the image pickup apparatus 2, when the incident light is received bythe solid-state image pickup device 1 (the pixel section 1 a) via theoptical system 221 and the shutter device 222, signal electric chargesbased on an amount of the received light are accumulated in each pixelP. The drive circuit 224 reads the signal electric charges accumulatedin each pixel P, and the read electric signals are outputted to thesignal process circuit 223. The output signal outputted from thesolid-state image pickup device 1 is subjected to a predetermined signalprocess in a signal process section 23, and may be outputted as an imagesignal Dout to the outside (for example, to a monitor), or may be heldin a storage section (a storage medium) such as a memory which is notillustrated.

Application Examples 2-1 and 2-2

FIG. 16 is a functional block diagram illustrating a generalconfiguration of an endoscopic camera (a capsule-type endoscopic camera3A) according to Application example 2-1. The capsule-type endoscopiccamera 3A includes an optical system 231, a shutter device 232, thesolid-state image pickup device 1 (the pixel section 1 a), a drivecircuit 234, a signal process circuit 233, a data transmission section235, a driving battery 236, and a gyro circuit 237 for sensing posture(such as directions and angles). Out of these components, the opticalsystem 231, the shutter device 232, the drive circuit 234, and thesignal process circuit 233 have functions similar to those of theoptical system 221, the shutter device 222, the drive circuit 224, andthe signal process circuit 223 that are described above for the imagepickup apparatus 2. However, the optical system 231 may be desirablycapable of picking up images in a plurality of azimuths (for example, inall azimuths) in a three-dimensional space. The optical system 231 isconfigured of one or a plurality of lenses. However, in the presentexample, an image signal D1 after being subjected to the signal processin the signal process circuit 233 and a posture sensing signal D2outputted from the gyro circuit 237 are transmitted to an outsidedevices by wireless communication via the data transmission section 235.

The endoscopic camera to which the solid-state image pickup device 1 inthe above-described embodiment is applicable is not limited toendoscopic cameras of a capsule-type as described above. Such anendoscopic camera may be, for example, an insertion-type endoscopiccamera (an insertion-type endoscopic camera 3B) (Application example2-2) as shown in FIG. 17. As with the configuration of part of theabove-described capsule-type endoscopic camera 3A, the insertion-typeendoscopic camera 3B includes the optical system 231, the shutter device232, the solid-state image pickup device 1 (the pixel section 1 a), thedrive circuit 234, the signal process circuit 233, and the datatransmission section 235. However, in the insertion-type endoscopiccamera 3B is further provided with an arm 238 a and a drive section 238.The arm 238 a is stored inside the apparatus. The drive section 238drives the arm 238 a. Such an insertion-type endoscopic camera 3B isconnected to a cable 239. The cable 239 includes a wiring 239A fortransmitting an arm control signal CTL to the drive section 238, and awiring 239B for transmitting an image signal Dout based on a picked-upimage.

Application Example 3

FIG. 18 is a functional block diagram illustrating a generalconfiguration of a vision chip (a vision chip 4) according toApplication example 3. The vision chip 4 is an artificial retina that isused by being embedded in part of a wall (a retina E2 that has visualnerves) in back of an eyeball E1 of an eye. The vision chip 4 may beused by being embedded, for example, in part of one of a ganglion cellC1, a horizontal cell C2, and a visual cell C3 in the retina E2. Thevision chip 4 may include, for example, the solid-state image pickupdevice 1, a signal process circuit 241, and a stimulation electrodesection 242. Due to such a configuration, the vision chip 4 acquires, bythe solid-state image pickup device 1, an electric signal based on lightincident on the eye. The acquired electric signal is processed in thesignal process circuit 241, and thereby, a predetermined control signalis supplied to the stimulation electrode section 242. The stimulationelectrode section 242 has a function to supply stimulation (an electricsignal) to the visual nerves in response to the inputted control signal.

Application Example 4

FIG. 19 is a functional block diagram illustrating a generalconfiguration of a biosensor (a biosensor 5) according to Applicationexample 4. The biosensor 5 may be, for example, a blood-glucose levelsensor that is attachable to a finger A. The biosensor 5 includes asemiconductor laser 251, the solid-state image pickup device 1, and asignal process circuit 252. The semiconductor laser 51 may be, forexample, an IR (infrared) laser that emits infrared light (with awavelength of 780 nm or larger). Due to such a configuration, thebiosensor 5 senses, with the use of the solid-state image pickup device1, absorption degree of laser light in accordance with a glucose levelin blood, and measures blood-glucose level.

The present disclosure has been described above referring to someembodiments and modifications, the content of the present disclosure isnot limited to the above-described illustrative embodiments and thelike, and may be variously modified. For example, in the above-describedembodiments and the like, there is exemplified a device structure inwhich the two photodiodes 11A and 11B are laminated in the semiconductorsubstrate 21. However, for example, a photoelectric conversion elementusing an organic photoelectric conversion film may be laminated on thesemiconductor substrate 21. Alternatively, the number of photodiodes tobe formed in the semiconductor substrate 21 may be three or more, or maybe one. The content of the present disclosure is applicable to anydevice that performs reading of signal electric charges from aphotodiode with the use of a vertical transistor.

The above embodiments have been described referring to a solid-stateimage pickup device of a back illumination type as an example. However,the content of the present disclosure is also applicable to asolid-state image pickup device of a front illumination type.

It is possible to achieve at least the following configurations from theabove-described example embodiments and the modifications of thedisclosure.

(1)

A solid-state image pickup device, comprising:

a semiconductor substrate;

a photodiode formed in the semiconductor substrate;

a transistor having a gate electrode, at least a portion of the gateelectrode being embedded in the semiconductor substrate, the transistorbeing configured to read a signal electric charge from the photodiodevia the gate electrode; and

an electric charge transfer layer provided in contact with the gateelectrode and the photodiode.

(2)

The solid-state image pickup device according to (1), wherein thephotodiode is one of a plurality of photodiodes that are laminated in athickness direction of the semiconductor substrate.

(3)

The solid-state image pickup device according to (1), wherein thephotodiode includes a photoelectric conversion layer of a firstconductivity type, and the electric charge transfer layer is an impuritydiffusion layer of the first conductivity type connected to a portion ofthe photoelectric conversion layer.(4)The solid-state image pickup device according to (1), whereinat least a portion of the gate electrode fills a concave section, theconcave section being formed in the semiconductor substrate, andat least a portion of the electric charge transfer layer is connected tothe gate electrode at a bottom face of the concave section.(5)The solid-state image pickup device according to (4), wherein theelectric charge transfer layer is formed adjacent to the bottom face ofthe concave section.(6)The solid-state image pickup device according to (4), further comprisinga dark current suppression layer of a second conductivity type incontact with the electric charge transfer layer and the bottom face ofthe concave section.(7)The solid-state image pickup device according to (4), wherein theelectric charge transfer layer covers the bottom face of the concavesection and a portion of side faces of the concave section.(8)A method of manufacturing a solid-state image pickup device, the method,comprising:forming a transistor having a gate electrode, at least a portion of thegate electrode being embedded in a semiconductor substrate that includesa photodiode, the transistor being configured to read a signal electriccharge from the photodiode via the gate electrode; andforming an electric charge transfer layer in contact with the gateelectrode and the photodiode.(9)The method according to (8), wherein the photodiode is one of aplurality of photodiodes that are laminated in a thickness direction ofthe semiconductor substrate.(10)The method according to (8), whereinthe photodiode includes a photoelectric conversion layer of a firstconductivity type, andthe electric charge transfer layer is an impurity diffusion layer of thefirst conductivity type connected to a portion of the photoelectricconversion layer.(11)The method according to (8), wherein a concave section is formed in thesemiconductor substrate during the forming of the transistor, and thegate electrode is formed to fill the concave section.(12)The method according to (11), wherein the electric charge transfer layeris formed by ion implantation through a bottom face of the concavesection after forming the concave section and before forming the gateelectrode.(13)The method according to (11), further comprising:forming a dark current suppression layer of a second conductivity typeby ion implantation through a bottom face of the concave section afterforming the electric charge transfer layer and before forming the gateelectrode,wherein the electric charge transfer layer is formed by ion plantationthrough the bottom face of the concave section after forming the concavesection and before forming the gate electrode.(14)The method according to (11), wherein the electric charge transfer layeris formed by performing ion implantation through a selective region inthe semiconductor substrate after forming the photodiode and beforeforming the concave section.(15)An electronic apparatus with a solid-state image pickup device accordingto (1).(16)A method for driving a solid-state image pickup device, the solid-stateimage pickup device comprising:

-   -   a semiconductor substrate;    -   a first photodiode formed in the semiconductor substrate;    -   a second photodiode formed in the semiconductor substrate;    -   a transistor having a gate electrode, at least a portion of the        gate electrode being embedded in the semiconductor substrate;        and    -   a floating diffusion region embedded in the semiconductor        substrate;    -   wherein a first charge of the first photodiode is transferred        through the gate electrode to the floating diffusion, and a        second charge of the second photodiode is transferred through        the gate electrode to the floating diffusion region.        (17)        The method according to (16), wherein the photodiode is one of a        plurality of photodiodes that are laminated in a thickness        direction of the semiconductor substrate.        (18)        The method according to (16), wherein the photodiode includes a        photoelectric conversion layer of a first conductivity type, and        an electric charge transfer layer is an impurity diffusion layer        of the first conductivity type connected to a portion of the        photoelectric conversion layer.        (19)        The method according to (16), wherein a concave section is        formed in the semiconductor substrate during the forming of the        transistor, and the gate electrode is formed to fill the concave        section.        (20)        The method according to (19), wherein an electric charge        transfer layer is formed by ion implantation through a bottom        face of the concave section after forming the concave section        and before forming the gate electrode.

It should be understood by those skilled in the art that variousmodifications, combinations, sub-combinations, and alterations may occurdepending on design requirements and other factors insofar as they arewithin the scope of the appended claims or the equivalents thereof.

REFERENCE SIGNS LIST

-   1 solid-state image pickup device-   11A, 11B photodiode-   21 semiconductor substrate-   12 FD-   13 electric charge transfer layer-   13 a dark current suppression layer-   14 gate electrode-   Tr vertical transistor-   H concave section-   Sb bottom face-   S1 circuit formation face-   S2 light receiving face

What is claimed:
 1. An image pickup device, comprising: a photoelectric conversion region formed in a semiconductor substrate; a transistor having a gate electrode, a part of the gate electrode being embedded in the semiconductor substrate; and a first region of a first conductivity type in the semiconductor substrate; wherein the first region is disposed between the part of the gate electrode embedded in the semiconductor substrate and the photoelectric conversion region in a depth direction of the semiconductor substrate, and wherein the first region is coupled to the photoelectric conversion region.
 2. The image pickup device according to claim 1, wherein the photoelectric conversion region is one of a plurality of photoelectric conversion regions that are positioned in the depth direction of the semiconductor substrate.
 3. The image pickup device according to claim 2, wherein the gate electrode fills a concave section in the semiconductor substrate, and further comprising: a second region of a second conductivity type that is in contact with the first region and a bottom face of the concave section.
 4. The image pickup device according to claim 3, wherein the first region is adjacent to the bottom face of the concave section and a portion of side faces of the concave section.
 5. The image pickup device according to claim 1, wherein the photoelectric conversion region has the first conductivity type, and the first region is an impurity diffusion layer of the first conductivity type connected to a portion of the photoelectric conversion region.
 6. The image pickup device according to claim 1, wherein the first conductivity type is n-type.
 7. The image pickup device according to claim 1, wherein the first region serves as a transfer path of signal electric charges and serves as an additional photoelectric conversion region.
 8. The image pickup device according to claim 1, wherein the part of the gate electrode embedded in the semiconductor substrate is covered with an insulating film.
 9. The image pickup device according to claim 8, wherein the first region is coupled to the insulating film.
 10. The image pickup device according to claim 1, wherein the gate electrode fills a concave section in the semiconductor substrate.
 11. The image pickup device according to claim 10, further comprising: a second region of a second conductivity type that is in contact with the first region and a bottom face of the concave section.
 12. The image pickup device according to claim 10, wherein the first region is adjacent to a bottom face of the concave section and a portion of side faces of the concave section.
 13. The image pickup device according to claim 10, further comprising: a floating diffusion adjacent to a first end of the gate electrode, wherein the first end is opposite from a bottom face of the concave section.
 14. The image pickup device according to claim 13, wherein the first region is a part of a transfer path of signal electric charges from the photoelectric conversion region to the gate electrode and the floating diffusion.
 15. The image pickup device according to claim 10, wherein the first region is self-aligned and adjacent to a bottom face of the concave section.
 16. The image pickup device according to claim 15, wherein the first region has a desired thickness based on a predetermined set dose amount in ion implantation and injection energy.
 17. The image pickup device according to claim 10, wherein the first region has a desired thickness based on a predetermined set dose amount in ion implantation and injection energy.
 18. The image pickup device according to claim 15, wherein defects that occur caused by a potential dip are reduced when transferring a signal electric charge through the first region based on a location of the first region in relation to the bottom face.
 19. The image pickup device according to claim 18, wherein a position that is a reference for the bottom face is set as a shallower position than a depth of the concave section in advance of forming the concave section.
 20. The image pickup device according to claim 1, further comprising: a second region of a second conductivity type, wherein the second region is disposed between the part of the gate electrode and the first region, and wherein the second region is coupled to the first region.
 21. The image pickup device according to claim 20, wherein the first conductivity type is n-type and the second conductivity type is p-type.
 22. The image pickup device according to claim 20, wherein the part of the gate electrode embedded in the semiconductor substrate is covered with an insulating film.
 23. The image pickup device according to claim 22, wherein the second region is coupled to the insulating film.
 24. The image pickup device according to claim 1, wherein the gate electrode fills a concave section in the semiconductor substrate and wherein the first region serves as a transfer path of signal electric charges to the gate electrode.
 25. The image pickup device according to claim 1, wherein a plurality of photoelectric conversion regions comprises the photoelectric conversion region and a secondary photoelectric conversion region, the secondary photoelectric conversion region being located adjacent to the gate electrode, and a length of the photoelectric conversion region is greater than a length of the secondary photoelectric conversion region, and wherein the length of the photoelectric conversion region and the length of the secondary of the photoelectric conversion region are measured in a direction perpendicular to the depth direction of the semiconductor substrate.
 26. The image pickup device according to claim 1, wherein a plurality of photoelectric conversion regions comprises the photoelectric conversion region and a secondary photoelectric conversion region, and wherein the secondary photoelectric conversion region receives light that has passed through the photoelectric conversion region.
 27. The image pickup device according to claim 26, wherein a length of the photoelectric conversion region is greater than a length of the secondary photoelectric conversion region, and the length of the photoelectric conversion region and the length of the secondary photoelectric conversion region are measured in a direction perpendicular to the depth direction of the semiconductor substrate.
 28. The image pickup device according to claim 1, wherein the first region has a first width in a direction perpendicular to the depth direction of the semiconductor substrate, and the photoelectric conversion region has a second width in the direction perpendicular to the depth direction of the semiconductor substrate, and wherein the second width is longer than the first width.
 29. An image pickup device, comprising: a photoelectric conversion region formed in a semiconductor substrate; a transistor having a gate electrode, a part of the gate electrode being embedded in the semiconductor substrate; a first region of a first conductivity type in the semiconductor substrate; wherein the first region is disposed between the part of the gate electrode embedded in the semiconductor substrate and the photoelectric conversion region, wherein the first region is coupled to the photoelectric conversion region, wherein the gate electrode fills a concave section in the semiconductor substrate, and wherein the first region serves as a transfer path of signal electric charges to the gate electrode; and a second region of a second conductivity type that is in contact with the first region and a bottom face of the concave section.
 30. The image pickup device according to claim 29, wherein the first region is adjacent to the bottom face of the concave section and a portion of side faces of the concave section.
 31. An electronic apparatus, comprising: a signal processing circuit; an optical system; and an image pickup device, comprising: a photoelectric conversion region formed in a semiconductor substrate; a transistor having a gate electrode, a part of the gate electrode being embedded in the semiconductor substrate; and a first region of a first conductivity type in the semiconductor substrate; wherein the first region is disposed between the part of the gate electrode embedded in the semiconductor substrate and the photoelectric conversion region in a depth direction of the semiconductor substrate, and wherein the first region is coupled to the photoelectric conversion region. 